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ICP-OES/ICP-MS Metals Testing

Inductively Coupled Plasma, or ICP, is a high-temperature excitation source that desolvates, vaporizes, and atomizes samples in aerosol form, and then ionizes the resulting atoms. The excited analyte ions and atoms can then subsequently be detected by observing their emission lines (inductively coupled plasma optical emission spectrometry, or ICP-OES), or the excited or ground state ions can be determined using a mass detector (inductively coupled plasma mass spectrometry, or ICP-MS).Both ICP-OES and ICP-MS may be used for either single element or sequential/simultaneous multi-element qualitative or quantitative analysis.

We are currently using the NexION 300D; the future in ICP-MS technology! It is engineered to deliver a level of stability, flexibility, and performance never before seen. It is capable of removing common mass interferences to deliver ultimate levels of detection even for elements traditionally problematic for ICP-MS, such as: Fe, As, Ca, Se, K, Cr, Mg, and V.

In addition, Robertson Microlit offers the ICP-MS multi-elemental scan, a service which provides a semi-quantitative determination of up to 81 elements in a single sample preparation. USP <232>/<233> also utilizes ICP-MS technology.